Bug #515

Input stage clipping diode causing deterioration of pulse edges

Added by Tomasz Wlostowski on 01 Jun 2012 at 11:04. Updated on 01 Oct 2012 at 17:13.

Status:Rejected Start date:2012-06-01
Priority:High Due date:
Assignee:Tomasz Wlostowski % Done:


Category:- Spent time: -
Target version:-


The BAR66 diode in the input stage was causing severe degradation of the falling edge of the signal (with Tf > 300 ns) when the input was clamped due to too high amplitude of the pulses. This combined with analog noise in the trigger resulted in spurious events in the TDC FIFO.

Fix: replace the diode with a fast Schottky RF diode. Tested with HSMS-2802-TR1G.

To be included in EDA-02267-V4-1.


EDA-02267-V4-0 BOM fix: D6 (BAR66) -> HSMS-2802-TR1G

Updated by Erik van der Bij on 05 Jun 2012 at 15:53

  • Priority changed from Urgent to High
  • Status changed from Resolved to Assigned

Still need to upgrade production files EDA-02267-V4-1.

Updated by Erik van der Bij on 01 Oct 2012 at 17:13

  • Status changed from Assigned to Rejected

Suggested change didn't work. See http://www.ohwr.org/issues/608.

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