Commit 258fd307 authored by Benoit Rat's avatar Benoit Rat

doc: workshop madrid add the WRS Tests section.

parent 28d5a1d7
......@@ -90,7 +90,7 @@ morekeywords={>,__global__, __device__}, % CUDA specific keywords
\begin{block}
{White Rabbit Switch Tests}
blabla
The procedure used to detect failure in production.
\end{block}
\begin{block}
......@@ -106,27 +106,129 @@ blabla
\end{frame}
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
\begin{frame}[allowframebreaks]
\frametitle{White Rabbit Switch Test}
\section{White Rabbit Switch Tests}
\begin{block}
{Block1}
\subsection{Pre-Test}
\begin{frame}{\insertsubsectionhead}
The first steps for production test are:
\begin{itemize}
\item FlyingProve done at the assembly company
\item Visual inspection of the PCBs (SCB \& Mini-BP)
\item Electrical inspection of the PCBs
\end{itemize}
% CAN NOT ADD the FIGURE???
%
% \begin{figure}[h!]
% \centering
% \includegraphics[height=3cm,bb=0 0 1783 868]{./SCB-electrical_test.png}
% %SCB-electrical_test.png: 1783x868 pixel, 72dpi, 62.89x30.62 cm, bb=0 0 1783 868
% \caption{Electrical Inspection}
% \end{figure}
\end{frame}
\subsection{The Bootstrap Test Procedure}
\begin{frame}{\insertsubsectionhead}
\begin{block}{}
The test of the switch has been intended to be as flat as possible,
this mean that we intend to test a component with the less dependency possible of other
component.
\end{block}
However we need to have at least the following working:
\begin{itemize}
\item ARM (detected during the flashing stage)
\item DDR (test during the flashing stage)
\item Linux load using Ethernet (TFTP/NFS)\footnote{Can be load directly using DDR in case Ethernet fail}
\end{itemize}
\end{frame}
\subsection{Actual Testing}
\begin{frame}[allowframebreaks]{\insertsubsectionhead}
The testing procedure is a series of scripts:
\begin{itemize}
\item 001-MD5 Checking.sh: Check MD5 of needed files
\item 002-USB.sh: Check the USB (Not implemented)
\item 003-FPGA Bridge.sh: CPU (EB1) <-> FPGA (WB)
\item 004-LED Checking.sh: LED of CPU \& miniBP
\item 005-FAN Checking.sh: FAN on/off and PWM speed
\item 006-FPGA QDRIIStress.sh: Stress the QDDR test.
\item 007-NF MT29F4G16.sh: NAND flash read/write full on (About 15m )
\item 008-DF AT45DB642.sh: Dataflash all position (6m).
\item 009-FPGA TempRetrieving.sh: Retrieve the temperature
\item 010-Flashing.sh: Flash with the latest stable firmware
\end{itemize}
\begin{block}{testing.sh}
Main scripts called to generate proper log
\begin{itemize}
\item ejem
\item ejem
\item S/N of the board
\item Timestamp of each steps
\item Error failure codes
\item Logging history
\end{itemize}
\end{block}
\begin{block}
{Block2}
\begin{block}{shw_tool.c}
Accessing to libswitchhw to test
\begin{itemize}
\item ejem
\item ejem
\item LEDs (GPIO, wishbone I2C)
\item FANs (PWN fan, GPIO)
\item Temperatures (wishbone I2C)
\end{itemize}
\end{block}
\end{frame}
\begin{frame}[fragile]{\insertsubsectionhead \ - Report}
The following is an example of the log history for board $014$ (v3.2)
\begin{verbatim}
/tftpboot/rootfs/alpha-pts/logs/output-032014_history.log
\end{verbatim}
\begin{lstlisting}
-----------------------------------------------
Fri Oct 12 12:24:08 CET 2012
001 > OK (00'02)
002 > OK (00'00)
003 > OK (00'10)
004 > OK (00'52)
005 > OK (00'52)
006 > OK (00'13)
007 > ERROR ( Sub0:OK Sub1:OK Sub2:OK Sub3:OK Sub4:50% Sub5:OK Sub6:OK) (22'40)
008 > OK (02'47)
009 > OK (00'14)
010 > OK (04'51)
-----------------------------------------------
Fri Oct 12 13:46:14 CET 2012
007 > OK (22'24)
\end{lstlisting}
\end{frame}
\begin{frame}
\begin{block}{Conclusion}
By doing these tests we improve the quality of the product:
\begin{itemize}
\item Checking the components
\item Checking the connection
\item Debugging the code (API)
\item Understanding better the sw/gw\\ $\Rightarrow$ {\bfseries Improve client support}
\end{itemize}
\end{block}
\end{frame}
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
\begin{frame}[allowframebreaks]
\frametitle{Testing Framework}
......
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