ADC Characterization Project
The aim of this project is documenting and establishing a routine procedure for characterization of high-speed ADC figures of merit.
It focuses on three main areas:
- Pedagogical: collection of relevant documentation on the subject and clarification of the underlying theory
- Procedural: specification of standard procedures
- Software: production of software aimed at ADC measurement
- The software implements IEEE 1241-2010 - IEEE Standard for Terminology and Test Methods for Analog-To-Digital Converters.
Project information
- ACT - ADC Characterization Toolkit, manual of software
- Repository
Contacts
- Juan David González Cobas - CERN
- Dimitris Lampridis - CERN
Status
Date | Event |
---|---|
01-09-2010 | Project start. |
14-09-2010 | User interface specification start. |
20-10-2010 | Work on function parameter definitions started |
03-09-2011 | Working version of ACT - ADC Characterization Toolkit. |
07-07-2017 | Found that tools should be reviewed for correctness. |
Commented References
-
IEEE 1241-2010 - IEEE Standard for Terminology and Test Methods for Analog-To-Digital Converters
The absolute reference on the subject. The ACT program implements this specification. -
[MT-001: Taking the Mystery out of the Infamous Formula, SNR=6.02N
- 1.76dB, and Why You Should
Care](https://www.ohwr.org/project/adc-testing/uploads/f8f35416f71d637c278fe89fcdec1acb/MT-001.pdf)
A lucid explanation of the concepts underlying SNR measurement and process gain. Original source here
- 1.76dB, and Why You Should
Care](https://www.ohwr.org/project/adc-testing/uploads/f8f35416f71d637c278fe89fcdec1acb/MT-001.pdf)
-
MT-003: Understand SINAD, ENOB, SNR, THD, THD + N, and SFDR so You Don't Get Lost in the Noise Floor
A nice discussion of the different figures of merit defining the noise characteristics of an ADC. Original source here -
Testing Data Converters
Chapter 5 of The Data Conversion Handbook edited by Walt Kester and published by Analog Devices. A good starting point. -
Understanding High Speed ADC Testing and Evaluation, Analog Devices Application Note AN-835
13 July 2017