Test results V1
The intention of the tests of the FMC DAC 250MSPS 16b 4CH V1 prototype was to verify the main functionality of the mezzanine card. Therefore, simple tests were carried out in order to start the development of the V2, rather than thoroughly testing the whole system.
The ML605 evaluation kit with a Xilinx Virtex 6 FPGA was used as a carrier card with a transition board between the mezzanine and the carrier cards. The FMC DAC 250MSPS 16b 4CH mezzanine was plugged on the HPC FMC connector of the ML605. A sine wave was generated with a signal generator and it was converted to a square wave with an evaluation kit AD9512. This square wave acts as a clock signal for the evaluation kit ML605 and for the transition board. A clock fanout on the transition board provides the two clock signals for the two Dual-DACs on the FMC DAC 250MSPS 16b 4CH mezzanine card. The transition board provides LVPECL clock signals for the mezzanine card, and the transition board also shifts some of the voltages between the carrier and the mezzanine card in order not to damage the carrier card FPGA. More information regarding the tests below.
Power supply and thermal tests
Fast Fourier Transform (FFT) of a Numerically Controlled Oscillator (NCO)
- NCO includes a phase accumulator and a CORDIC algorithm which performs a phase-to-amplitude conversion (processed in the FPGA)
- Test report - FFT
Analog front-end tests
- DAC AD9747 Spurious Free Dynamic Range (SFDR)
- Amplifier comparison AD8045 and LMH6702 according to their SFDR
- Passband flatness of the AD9747 and LMH6702
- Phase noise and jitter of the AD9747 and LMH6702
- Amplifier offset voltage compensation with a potentiometer
- Test report - Analog front-end V1
Serial Peripheral Interface bus (SPI)
Petri Leinonen - 21th of May 2013