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# Improving reliability and performance of the blocking output
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The document describes the causes of failure in the blocking output
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stage, particularly that of the BSH103 power MOSFET.
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The [document](https://www.ohwr.org/project/conv-ttl-blo-hw/wikis/Documents/Protection-of-the-blocking-output-circuit) describes the causes
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of failure in the blocking output stage, particularly that of the BSH103
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power MOSFET.
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Some hardware modifications are proposed and verified on a test board.
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Moreover, pulse repetition frequency is discussed, in view of expanding
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the board's use to fast burst scenarios.
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